G-ray’s latenium™ detectors to provide real-time quality control

Empa and G-ray join forces to develop a revolutionary additive manufacturing platform Hauterive, Neuchâtel, 22 May 2019 G-ray’s latenium™ X-ray…

G-ray presents its latenium™ technology at the 15th Vienna Conference on Instrumentation

Towards wafer-scale monolithic CMOS integrated pixel detectors for X-ray photon counting Hauterive, Neuchatel, 21 February 2019 A new semiconductor…

G-ray Nanotech and the Leibniz-Institut für Kristallzüchtung (IKZ) join forces to develop detector-grade Gallium Arsenide wafers

New platform for very high performance X-ray detectors - Hauterive, Neuchâtel, 24 February 2019 – G-ray Nanotech and IKZ have entered into a research…

G-ray Nanotech and CSEM reach a major milestone in the development of the latenium™ technology

Hauterive, Neuchâtel, 20 December 2018 – G-ray Nanotech and CSEM have achieved a major milestone in packaging the latenium™ technology to…